
ST72321xx-Auto Electrical characteristics
Doc ID 13829 Rev 1 201/243
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19.7.2 EMI (electromagnetic interference)
Based on a simple application running on the product (toggling two LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Table 122. EMS test results
Symbol Parameter Conditions Level/Class
V
FESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
Flash device:
V
DD
5V, T
A
+25°C, f
OSC
8MHz,
conforms to IEC 1000-4-2
4B
ROM device:
V
DD
5V, T
A
+25°C, f
OSC
8 MHz,
conforms to IEC 1000-4-2
4A
V
FFTB
Fast transient voltage burst limits to be applied
through 100pF on V
DD
and V
DD
pins to induce a
functional disturbance
V
DD
5V, T
A
+25°C, f
OSC
8 MHz,
conforms to IEC 1000-4-4
3B
Table 123. EMI emissions
Symbol Parameter
Conditions
Monitored
frequency band
Max vs [f
OSC
/f
CPU
]
(1)
Unit
V
DD
5V, T
A
+25°C,
conforming to SAE J 1752/3
8/4 MHz 16/8 MHz
S
EMI
Peak level
60 Kbyte Flash devices in
LQFP64 package
0.1 MHz to 30 MHz 15 20
dBµV30 MHz to 130 MHz 20 27
130MHz to 1GHz 0 5
SAE EMI Level 2.5 3 -
1. Data based on characterization results, not tested in production.
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